Paper presented at ICSOFT 2021

July 9, 2021

A paper authored by Dániel Vince, Renáta Hodován, and Ákos Kiss, titled “Reduction-assisted Fault Localization: Don't Throw Away the By-products!” has been accepted for and presented at the ICSOFT conference.

In the article, which was recently presented at the 16^th International Conference on Software Technologies (ICSOFT), test case reduction is proposed to assist spectrum-based fault localization (SBFL) in cases where the statistics are unbalanced (such as during fuzz-testing). When using the by-products of test case reduction, the authors increased SBFL’s precision by almost 50% in a real-world use-case.